Abstract:
Lead zirconate titanate (PZT) is a ferroelectric ceramic used in many advanced applications
such as sonar, piezo transformer and pressure sensors. This study was conducted to prepare lead
zirconate titanate (PZT) thin film on platinum substrate by electrophoretic deposition (EPD). The EPD
was used due to its fairly rapid low cost process.
The preparation of PZT films was done on a 10-millimeter-diameter platinum substrate by
the EPD. The electric fields were applied between two electrodes in the range of 50, 100 and 200
volts for the deposition times at 4, 6, 8 and 10 minutes. After that, the PZT films were sintered at
1250℃ for 2 hours. The films were then characterized in terms of physical, microstructure, dielectric
and piezoelectric properties by the Scanning Electron Microscope (SEM), X-ray diffraction (XRD),
Piezoe d-meter Model CADT, and Impedance analyzer.
The results showed that the thickness of the PZT films increased with an increase of electric
fields and deposition times. However, the higher the electric field, the lower the density of the films.
The appropriate amount of phosphate esters that resulted in smooth and even films with 100-volt
electric field lasting for 4 minutes was 0.65% by weight. For their piezoelectric properties after being
sintered, it was found that the thickness of films was approximately 0.5 millimeter with the density
of 7.84 g/cm [superscript3]. The films also responded to the resonance frequencies between 1500 and 1700 kHz, and its d[subscript33], k[subscript P], Q [subscript M], values were 259 [subscript P]C/N, 0.62, 540 respectively.